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Product Overview
VK-X100/X200 Series
3D Laser Scanning Microscope
200x - 24,000x magnification
0.5 nanometer Z-axis resolution on almost any material
High-resolution, large depth-of-field observation
Profile and roughness measurements with zero sample preparation
Measures thickness and uniformity of clear layers
No data loss - even on steep angles
Perform measurements with just a single click
Combines the capabilities of an optical microscope, SEM and roughness gauge